EMC China Lab

EMC Test Labs California

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Update time : 2024-05-11

We understand that you are looking for an EMC (Electro Magnetic Compatibility) testing laboratory in California. However, we still want to help you understand us; because compared to local California laboratories, we can save you 30% on testing and certification costs.

EMC Test Labs California(图1)

1. Introduction to electromagnetic compatibility testing

Electromagnetic compatibility laboratories are special laboratories established for conducting electromagnetic compatibility tests. First, let's explain the basic concept of electromagnetic compatibility: it refers to the ability of electromagnetic systems and subsystems to work normally in their respective electromagnetic environments without being degraded by electromagnetic interference. In order to verify whether the EMC design of electronic and electrical equipment is good, it is necessary to test the emission interference, transmission characteristics and load tolerance of various electromagnetic interference sources throughout the research and development process to verify whether the equipment meets the relevant electromagnetic compatibility standards and specifications.

 

2. JJRLAB Testing - Introduction to Electromagnetic Compatibility Laboratory

JJRLAB Testing 's electromagnetic compatibility laboratory has established complete electromagnetic compatibility (EMI, EMS) capabilities in South China, with 1 10m anechoic chamber, 4 3m anechoic chambers, 5 shielded rooms and EMS anti-interference rooms; the 10m and a 9*6*6 chamber meet the EMC test requirements of medical equipment , with maximum voltage and current of 380V/200A (three-phase) and 1000V/200 (DC) , wide testing capabilities, accurate test data, and can provide complete CE , FCC , VCCI and other national EMC regulations and pre-testing services for the majority of electronic manufacturers.

 

3. Electromagnetic compatibility certification project

Americas: fcc sdoc, fcc id, ISED, ISED ID, etc.;

Europe: CE-EMC, E-Mark, etc.

Asia: CCC, CQC, bsmi, KC, VCCI, PSE, etc.;

Australia: C-TICK, RCM, etc.;

 

IV. Electromagnetic compatibility testing items and standards

Electromagnetic compatibility testing includes electromagnetic interference testing (EMI) and electromagnetic tolerance testing (EMS). Electromagnetic compatibility standards require that electronic and electrical equipment related products must comply with radiated interference and conducted interference emission specifications, as well as radiated tolerance and conducted tolerance specifications.

 

1. Electromagnetic interference (EMI, including CE and RE). The main contents of the test include: testing the conducted interference and radiated interference emission of electronic and electrical products and equipment in various electromagnetic noise environments, and testing the interference transfer characteristics during various signal transmissions.

 

(II) The main contents of the electromagnetic tolerance (EMS, including CS and RS) test are:

1. Radiation tolerance test for electric and magnetic fields;

2. Conducted tolerance test of interference injection into power lines, control lines, signal lines, ground lines, etc.;

3. Tolerance test for electrostatic discharge and various transient electromagnetic waves (surge or electrical fast transient).

 

Test items

standard

Space Radiation

CISPR32 & 11 &14-1 &15, en55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15,

ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI,

GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824

Conducted Interference

CISPR32 & 11 &14-1 &15, EN55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15,

ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI,

GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824

Power Clamp

CISPR14-1,EN55014-1,AS CISPR14-1, GB4343.1, KN14-1; GB/T 13837

Magnetic Emission

CISPR15, EN55015, AS/NZS CISPR15, GB/T17743

Harmonic Current

IEC/en61000-3-2

Voltage fluctuation and flicker

IEC/EN61000-3-3

Electrostatic Discharge (ESD)

IEC/EN61000-4-2、GB/T17626.2

Radiated immunity (R/S)

IEC/EN61000-4-3、GB/T17626.3

Pulse group immunity (EFT/B)

IEC/EN61000-4-4、GB/T17626.4

SURGE

IEC/EN61000-4-5、GB/T17626.5

Conducted interference immunity (C/S)

IEC/EN61000-4-6、GB/T17626.6

Power frequency magnetic field (M/S)

IEC/EN61000-4-8、GB/T17626.8

Voltage dips/interruptions (DIPS)

IEC/EN61000-4-11、GB/T17626.11

Ring wave

IEC/EN61000-4-12、GB/T17626.12

Harmonic and interharmonic anti-interference

TEC/EN61000-4-13、GB/T17626.13

 

5. Electromagnetic Compatibility Laboratory

Test Site

Pilot projects

standard

Remark 

3m method full anechoic chamber

Radiated Emissions 

GB4824-2004(CISPR11-2003) 

GB9254-2008(CISPR22-2006) 

30MHz 

Radiated immunity 

GB17626.3-2006(IEC61000-4-3:2002) 

80MHz 

Conducted immunity measurement shielded room

Electrical fast transient burst immunity test 

GB17626.4 

Up to 7kV 

Immunity to conducted disturbances induced by radio frequency fields 

GB17626.6 

Up to 30V 

Insertion loss test for electrical lighting and similar equipment 

GB17743 

9KHz-30MHz 

Radiated electromagnetic disturbance test for electrical lighting and similar equipment 

GB17743 


Harmonic flicker measurement shielded room

Harmonic current emission test 

GB17625.1-2012(IEC 61000-3-2:2009) 

GB17625.6-2003(IEC 61000-3-4:1998) 

GB17625.7-2013 

Up to 75A 

Voltage changes, voltage fluctuations and flicker 

GB17625.2-2007(IEC 61000-3-3:2005) 

GB17625.3-2000(IEC 61000-3-5:1994) 

Up to 100A 

AC power port harmonic immunity 

GB17626.13-2006(IEC 61000-4-13:2002) 

Up to 100A 

Voltage fluctuation immunity test 

GB17626.14-2005(IEC 61000-4-14:2002) 

Up to 100A 

DC ripple immunity 

GB17626.17-2005(IEC 61000-4-17:2002) 

Up to 100A 

Three-phase voltage unbalance test 

GB17626.27-2006(IEC 61000-4-27:2000) 

Up to 100A 

Power frequency change immunity 

GB17626.28-2006(IEC 61000-4-28:2001) 

Up to 100A 

Voltage sags, short interruptions and voltage variations greater than 16A 

GB17626.34-2012(IEC 61000-4-34:2009) 

Up to 100A 

Voltage sag, short interruption and voltage variation at DC power input port 

GB17626.29-2006(IEC 61000-4-29:2000) 

Up to 100A 

Electrostatic discharge measurement shielded room

Electrostatic discharge immunity test 

GB17626.2-2006(IEC 61000-4-2:2001) 

Up to 30kV 

Voltage dips, short interruptions and voltage variations 

GB17626.11-2008(IEC 61000-4-11:2004) 

Up to 100A; power off (0-100%) 

Low frequency common mode conducted immunity 

GB17626.16-2007(IEC 61000-4-16:2002) 

Maximum disturbance level 30V 

Transient immunity measurement shielded room

Surge immunity 

GB17626.5-2008(IEC 61000-4-5:2005) 

Up to 10kV 

Damped oscillating magnetic field immunity 

GB17626.10-1998(IEC 61000-4-10:1993) 

Up to 3kV; three-phase 440V /100A; 

Oscillation wave immunity test 

GB17626.12-1998(IEC 61000-4-12:1995) 

Up to 3kV; three-phase 440V /100A 

Power frequency magnetic field immunity 

GB17626.8-2006(IEC 61000-4-8:2001) 

Short-term up to 1000A/m 

Pulse magnetic field immunity 

GB17626.9-2011(IEC 61000-4-9:2001) 

Up to 2000A/m 


Email:hello@jjrlab.com


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