EMC Test Labs California
We understand that you are looking for an EMC (Electro Magnetic Compatibility) testing laboratory in California. However, we still want to help you understand us; because compared to local California laboratories, we can save you 30% on testing and certification costs.
1. Introduction to electromagnetic compatibility testing
Electromagnetic compatibility laboratories are special laboratories established for conducting electromagnetic compatibility tests. First, let's explain the basic concept of electromagnetic compatibility: it refers to the ability of electromagnetic systems and subsystems to work normally in their respective electromagnetic environments without being degraded by electromagnetic interference. In order to verify whether the EMC design of electronic and electrical equipment is good, it is necessary to test the emission interference, transmission characteristics and load tolerance of various electromagnetic interference sources throughout the research and development process to verify whether the equipment meets the relevant electromagnetic compatibility standards and specifications.
2. JJRLAB Testing - Introduction to Electromagnetic Compatibility Laboratory
JJRLAB Testing 's electromagnetic compatibility laboratory has established complete electromagnetic compatibility (EMI, EMS) capabilities in South China, with 1 10m anechoic chamber, 4 3m anechoic chambers, 5 shielded rooms and EMS anti-interference rooms; the 10m and a 9*6*6 chamber meet the EMC test requirements of medical equipment , with maximum voltage and current of 380V/200A (three-phase) and 1000V/200 (DC) , wide testing capabilities, accurate test data, and can provide complete CE , FCC , VCCI and other national EMC regulations and pre-testing services for the majority of electronic manufacturers.
3. Electromagnetic compatibility certification project
Americas: fcc sdoc, fcc id, ISED, ISED ID, etc.;
Europe: CE-EMC, E-Mark, etc.
Asia: CCC, CQC, bsmi, KC, VCCI, PSE, etc.;
Australia: C-TICK, RCM, etc.;
IV. Electromagnetic compatibility testing items and standards
Electromagnetic compatibility testing includes electromagnetic interference testing (EMI) and electromagnetic tolerance testing (EMS). Electromagnetic compatibility standards require that electronic and electrical equipment related products must comply with radiated interference and conducted interference emission specifications, as well as radiated tolerance and conducted tolerance specifications.
1. Electromagnetic interference (EMI, including CE and RE). The main contents of the test include: testing the conducted interference and radiated interference emission of electronic and electrical products and equipment in various electromagnetic noise environments, and testing the interference transfer characteristics during various signal transmissions.
(II) The main contents of the electromagnetic tolerance (EMS, including CS and RS) test are:
1. Radiation tolerance test for electric and magnetic fields;
2. Conducted tolerance test of interference injection into power lines, control lines, signal lines, ground lines, etc.;
3. Tolerance test for electrostatic discharge and various transient electromagnetic waves (surge or electrical fast transient).
Test items | standard |
Space Radiation | CISPR32 & 11 &14-1 &15, en55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15, ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI, GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824 |
Conducted Interference | CISPR32 & 11 &14-1 &15, EN55032 & 11 &14-1 &15, AS/NZS CISPR32 & 11 &14-1 &15, KN32 & 11 &14-1 &15, ICES-003 & ICES-005&ICES-001, FCC Part15 & 18, VCCI, GB/T9254, GB/T13837, GB/T17743, GB4343.1,GB 4824 |
Power Clamp | CISPR14-1,EN55014-1,AS CISPR14-1, GB4343.1, KN14-1; GB/T 13837 |
Magnetic Emission | CISPR15, EN55015, AS/NZS CISPR15, GB/T17743 |
Harmonic Current | IEC/en61000-3-2 |
Voltage fluctuation and flicker | IEC/EN61000-3-3 |
Electrostatic Discharge (ESD) | IEC/EN61000-4-2、GB/T17626.2 |
Radiated immunity (R/S) | IEC/EN61000-4-3、GB/T17626.3 |
Pulse group immunity (EFT/B) | IEC/EN61000-4-4、GB/T17626.4 |
SURGE | IEC/EN61000-4-5、GB/T17626.5 |
Conducted interference immunity (C/S) | IEC/EN61000-4-6、GB/T17626.6 |
Power frequency magnetic field (M/S) | IEC/EN61000-4-8、GB/T17626.8 |
Voltage dips/interruptions (DIPS) | IEC/EN61000-4-11、GB/T17626.11 |
Ring wave | IEC/EN61000-4-12、GB/T17626.12 |
Harmonic and interharmonic anti-interference | TEC/EN61000-4-13、GB/T17626.13 |
5. Electromagnetic Compatibility Laboratory
Test Site | Pilot projects | standard | Remark |
3m method full anechoic chamber | Radiated Emissions | GB4824-2004(CISPR11-2003) GB9254-2008(CISPR22-2006) | 30MHz |
Radiated immunity | GB17626.3-2006(IEC61000-4-3:2002) | 80MHz | |
Conducted immunity measurement shielded room | Electrical fast transient burst immunity test | GB17626.4 | Up to 7kV |
Immunity to conducted disturbances induced by radio frequency fields | GB17626.6 | Up to 30V | |
Insertion loss test for electrical lighting and similar equipment | GB17743 | 9KHz-30MHz | |
Radiated electromagnetic disturbance test for electrical lighting and similar equipment | GB17743 | ||
Harmonic flicker measurement shielded room | Harmonic current emission test | GB17625.1-2012(IEC 61000-3-2:2009) GB17625.6-2003(IEC 61000-3-4:1998) GB17625.7-2013 | Up to 75A |
Voltage changes, voltage fluctuations and flicker | GB17625.2-2007(IEC 61000-3-3:2005) GB17625.3-2000(IEC 61000-3-5:1994) | Up to 100A | |
AC power port harmonic immunity | GB17626.13-2006(IEC 61000-4-13:2002） | Up to 100A | |
Voltage fluctuation immunity test | GB17626.14-2005(IEC 61000-4-14:2002) | Up to 100A | |
DC ripple immunity | GB17626.17-2005(IEC 61000-4-17:2002) | Up to 100A | |
Three-phase voltage unbalance test | GB17626.27-2006(IEC 61000-4-27:2000) | Up to 100A | |
Power frequency change immunity | GB17626.28-2006(IEC 61000-4-28:2001) | Up to 100A | |
Voltage sags, short interruptions and voltage variations greater than 16A | GB17626.34-2012(IEC 61000-4-34:2009) | Up to 100A | |
Voltage sag, short interruption and voltage variation at DC power input port | GB17626.29-2006(IEC 61000-4-29:2000) | Up to 100A | |
Electrostatic discharge measurement shielded room | Electrostatic discharge immunity test | GB17626.2-2006(IEC 61000-4-2:2001) | Up to 30kV |
Voltage dips, short interruptions and voltage variations | GB17626.11-2008(IEC 61000-4-11:2004) | Up to 100A; power off (0-100%) | |
Low frequency common mode conducted immunity | GB17626.16-2007(IEC 61000-4-16:2002） | Maximum disturbance level 30V | |
Transient immunity measurement shielded room | Surge immunity | GB17626.5-2008(IEC 61000-4-5:2005) | Up to 10kV |
Damped oscillating magnetic field immunity | GB17626.10-1998(IEC 61000-4-10:1993) | Up to 3kV; three-phase 440V /100A; | |
Oscillation wave immunity test | GB17626.12-1998(IEC 61000-4-12:1995) | Up to 3kV; three-phase 440V /100A | |
Power frequency magnetic field immunity | GB17626.8-2006(IEC 61000-4-8:2001) | Short-term up to 1000A/m | |
Pulse magnetic field immunity | GB17626.9-2011(IEC 61000-4-9:2001) | Up to 2000A/m |
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